2000 Research Publications

Microscopy and Microanalysis, Centre for

Journal Articles

Baroni, T.C., Griffin, B.J., Browne, J.R. and Lincoln, F.J. Correlation Between Charge Contrast Imaging and the Distribution of Some Trace Level Impurities in Gibbsite, Journal of Microscopy and Microanalysis, 6:1, pp 49-58 (2000)

Griffin, B.J. and Browne, J.R. Fiber-optic Based Spectral Catholodoluminescence: Simple and Economic Option for Use in Conventional and Environmental Scanning Electron Microscopy, Journal of Microscopy and Microanalysis, 6:1, pp 42-48 (2000)

Griffin, B.J. Charge Contrast Imaging of Material Growth and Defects in Environmental Scanning Electron Microscopy - Linking Electron Emission and Cathodoluminescence, Scanning, 22: pp 234-242 (2000)

Watt, G.R., Oliver, N.H.S. and Griffin, B.J.Evidence for Reaction-induced Microfracturing in Granulite Facies Migmatites, Geology, 28:4, pp 327-330 (2000)

Yu, Q., Tang, C. and Kuo, J. A critical review on methods to measure apoplastic pH in plants, Plant & Soil, 219: pp 29-40 (2000)

Conference Publications

Baroni, T.C., Griffin, B.J. and Lincoln, F.J. A Study of FIB Irradiation Damage by Low Voltage Microanalysis, Second Conference of the International Union of Microbeam Analysis Societies, UK, Institute of Physics Publishing, 165: pp 255-256 (2000)

Drouin, D., Aimez, V., Hugon, X., Griffin, B.J., Beauvais, J. and Beerens, J.Combined Secondary and Backscattered Electron Detector for Variable Pressure Scanning Electron Microscopes (VPSEM), Second Conference of the International Union of Microbeam Analysis Societies, UK, Institute of Physics Publishing, none:165, pp 271-272 (2000)

Griffin, B.J., Browne, J., Baroni, T., Drouin, D. and Hinckley, S. Contactless Imaging and Low Voltage Microanalysis of Contaminants, Defects and Dopants in and on Silicon Wafer, Silicon Nitride Films on Vallium Arsenide and Mercury Cadmium Telluride Devices by ESEM, 2000 MRS Fall Meeting, Boston, Materials Research Society, 633: p 453 (2000)

Griffin, B.J., Browne, J.R. and Baroni, T.C. Low Voltage and Low Vacuum-Imaging and X-ray Microanalysis, Microbeam Analysis 2000, United Kingdom, Institute of Physics Publishing, 165: p 263 (2000)

Griffin, B.J. and Browne, J.R. New Developments in Environmental Scanning Electron Microscopy, 7th Asia-Pacific Electron Microscopy Conference, Singapore, Times Publishing Group, none given: pp 62-63 (2000)

Griffin, B.J., Forbes, D. and McNaughton, N.J. An Evaluation of Dating of Diagenetic Zenotime by Electron Microprobe, Microscopy and Microanalysis 2000, New York, Springer, 6: pp 408-409 (2000)

Griffin, B.J., Nockolds, C.E., Phillips, M.R. and Remond, G. New Needs for Imaging and X-ray Microanalysis Standards: ESEM, Chime and Low Voltage Microanalysis, Second Conference of the International Union of Microbeam Analysis Societies 2000, UK, Institute of Physics Publishing, none: p 395 (2000)

Griffin, B.J., Browne, J.R., Egerton-Warburton, L. and Drouin, D. 'Secondary' Electron Detector Design and Positioning in the Variable Pressure Scanning Electron Microscope: the Colour Option, Microscopy and Microanalysis 2000, New York, Springer, 6: pp 772-773 (2000)

Kuo, J. Taxonomic notes on Halophila ovata and Halophila minor, Biologia Marina Mediterranea, Genova Italy, Societa Italiana Di Biologia Marina, 7: pp 79-82 (2000)

Phillips, M.R., Toth, M. and Griffin, B.J. X-ray Microanalysis of Insulators in the ESEM, Microscopy and Microanalysis 2000, New York, Springer, 6: pp 786-787 (2000)